conference 2024 international
STMA: A fast visual field defect assessment method using quadtree and head mounted display
Chao Ge, Zhenyang Zhu, Kenji Kashiwagi, Masahiro Toyoura, Kentaro Go, Issei Fujishiro, Xiaoyang Mao
Chao Ge, Zhenyang Zhu, Kenji Kashiwagi, Masahiro Toyoura, Kentaro Go, Issei Fujishiro, Xiaoyang Mao
Ryo Oji, Issei Fujishiro
Masanori Nakayama, Megumi Nomura, Issei Fujishiro
Yasunari Ikeda, Yutaro Togo, Issei Fujishiro
Kaiki Yuasa, Masanori Nakayama, Issei Fujishiro